SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield

Hdl Handle:
http://hdl.handle.net/10149/565827
Title:
SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield
Authors:
Saw, S. H. (Sor Heoh); Rawat, R. S. (Rajdeep Singh); Lee, P. (Paul); Talebitaher, A. (Alireza); Abdou, A. E. (Ali); Chong, P. L. (Perk Lin); Roy, F. (Federico); Ali, J. (Jalil); Lee, S. (Sing)
Affiliation:
Teesside University. School of Science and Engineering
Citation:
Saw, S. H., Rawat, R. S., Lee, P., Talebitaher, A., Abdou, A. E., Chong, P. L., Roy, F., Ali, J., Lee, S. (2013) 'SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield' IEEE Transactions on Plasma Science; 41 (11):3166
Publisher:
IEEE
Journal:
IEEE Transactions on Plasma Science
Issue Date:
Nov-2013
URI:
http://hdl.handle.net/10149/565827
DOI:
10.1109/TPS.2013.2281333
Additional Links:
http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6612699
Type:
Article
Language:
en
ISSN:
0093-3813; 1939-9375
Rights:
Author can archive post-print (ie final draft post-refereeing). For full details see http://www.sherpa.ac.uk/romeo [Accessed: 11/08/2015]

Full metadata record

DC FieldValue Language
dc.contributor.authorSaw, S. H. (Sor Heoh)en
dc.contributor.authorRawat, R. S. (Rajdeep Singh)en
dc.contributor.authorLee, P. (Paul)en
dc.contributor.authorTalebitaher, A. (Alireza)en
dc.contributor.authorAbdou, A. E. (Ali)en
dc.contributor.authorChong, P. L. (Perk Lin)en
dc.contributor.authorRoy, F. (Federico)en
dc.contributor.authorAli, J. (Jalil)en
dc.contributor.authorLee, S. (Sing)en
dc.date.accessioned2015-08-11T13:12:17Zen
dc.date.available2015-08-11T13:12:17Zen
dc.date.issued2013-11en
dc.identifier.citationIEEE Transactions on Plasma Science; 41 (11):3166en
dc.identifier.issn0093-3813en
dc.identifier.issn1939-9375en
dc.identifier.doi10.1109/TPS.2013.2281333en
dc.identifier.urihttp://hdl.handle.net/10149/565827en
dc.language.isoenen
dc.publisherIEEEen
dc.relation.urlhttp://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6612699en
dc.rightsAuthor can archive post-print (ie final draft post-refereeing). For full details see http://www.sherpa.ac.uk/romeo [Accessed: 11/08/2015]en
dc.titleSXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yielden
dc.typeArticleen
dc.contributor.departmentTeesside University. School of Science and Engineeringen
dc.identifier.journalIEEE Transactions on Plasma Scienceen
or.citation.harvardSaw, S. H., Rawat, R. S., Lee, P., Talebitaher, A., Abdou, A. E., Chong, P. L., Roy, F., Ali, J., Lee, S. (2013) 'SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield' IEEE Transactions on Plasma Science; 41 (11):3166en
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