Multicomponent tellurite thin film materials with high refractive index

Hdl Handle:
http://hdl.handle.net/10149/98297
Title:
Multicomponent tellurite thin film materials with high refractive index
Authors:
Weng, L. T. (Luqian); Hodgson, S. N. B. (Simon)
Affiliation:
University of Loughborough. Institute of Polymer Technology and Materials Engineering.
Citation:
Weng, L. Q. and Hodgson, S. N. B. (2002) 'Multicomponent tellurite thin film materials with high refractive index', Optical Materials, 19 (3), pp.313-317.
Publisher:
Elsevier
Journal:
Optical Materials
Issue Date:
May-2002
URI:
http://hdl.handle.net/10149/98297
DOI:
10.1016/S0925-3467(01)00228-2
Abstract:
Sol-gel processing has been used to prepare optically transparent thin films in the system TeO2-TiO2. The structure and morphology of the thin films were investigated by X-ray diffraction (XRD) and field emission microscopy (FEM). The calculated refractive index, band gap and Urbach energy values for the thin films are consistent with the values obtained in other studies of conventionally melted tellurite and multicomponent tellurite glasses. The results show that the thin films by sol-gel processing offers an attractive route for the fabrication of such materials into devices.
Type:
Article
Language:
en
Keywords:
optical properties; sol-gel processing; TeO2-TiO2 thin films
ISSN:
0925-3467
Rights:
Author can archive post-print (ie final draft post-refereeing). For full details see http://www.sherpa.ac.uk/romeo/ [Accessed 10/05/2010]
Citation Count:
18 [Scopus, 10/05/2010]

Full metadata record

DC FieldValue Language
dc.contributor.authorWeng, L. T. (Luqian)en
dc.contributor.authorHodgson, S. N. B. (Simon)en
dc.date.accessioned2010-05-10T11:48:04Z-
dc.date.available2010-05-10T11:48:04Z-
dc.date.issued2002-05-
dc.identifier.citationOptical Materials; 19(3):313-317en
dc.identifier.issn0925-3467-
dc.identifier.doi10.1016/S0925-3467(01)00228-2-
dc.identifier.urihttp://hdl.handle.net/10149/98297-
dc.description.abstractSol-gel processing has been used to prepare optically transparent thin films in the system TeO2-TiO2. The structure and morphology of the thin films were investigated by X-ray diffraction (XRD) and field emission microscopy (FEM). The calculated refractive index, band gap and Urbach energy values for the thin films are consistent with the values obtained in other studies of conventionally melted tellurite and multicomponent tellurite glasses. The results show that the thin films by sol-gel processing offers an attractive route for the fabrication of such materials into devices.en
dc.language.isoenen
dc.publisherElsevieren
dc.rightsAuthor can archive post-print (ie final draft post-refereeing). For full details see http://www.sherpa.ac.uk/romeo/ [Accessed 10/05/2010]en
dc.subjectoptical propertiesen
dc.subjectsol-gel processingen
dc.subjectTeO2-TiO2 thin filmsen
dc.titleMulticomponent tellurite thin film materials with high refractive indexen
dc.typeArticleen
dc.contributor.departmentUniversity of Loughborough. Institute of Polymer Technology and Materials Engineering.en
dc.identifier.journalOptical Materialsen
ref.citationcount18 [Scopus, 10/05/2010]en
or.citation.harvardWeng, L. Q. and Hodgson, S. N. B. (2002) 'Multicomponent tellurite thin film materials with high refractive index', Optical Materials, 19 (3), pp.313-317.-
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