The role of SiO2 impurities in the microstructure and properties of Y-TZP

Hdl Handle:
http://hdl.handle.net/10149/98428
Title:
The role of SiO2 impurities in the microstructure and properties of Y-TZP
Authors:
Hodgson, S. N. B. (Simon); Cawley, J. D. (Jess); Clubley, M.
Affiliation:
Loughborough University. Institute of Polymer Technology and Materials Engineering.
Citation:
Hodgson, S. N. B., Cawley, J. and Clubley, M. (1998) 'The role of SiO2 impurities in the microstructure and properties of Y-TZP', Journal of Materials Processing Technology, 86 (1-3), pp.139-145.
Publisher:
Elsevier
Journal:
Journal of Materials Processing Technology
Issue Date:
Feb-1998
URI:
http://hdl.handle.net/10149/98428
DOI:
10.1016/S0924-0136(98)00302-1
Abstract:
A study has been carried out into the effects of SiO2 impurities at the 0-1 mass% level on the sintering characteristics, microstructure, phase composition, and mechanical properties of Y-TZP. The results show that SiO2 improves sintering at low temperatures, but gives rise to increasing grain boundary phase formation and reduction in sintered density for higher sintering temperatures. X-ray diffraction studies indicated that SiO2 impurities at these levels did not significantly affect the stability of the tetragonal phase responsible for the transformation-toughening phenomena, although significant effects on the mechanical properties of the material were observed. A model is proposed to account for these effects in terms of the microstructural changes associated with the presence of SiO2 and changes in sintering conditions.
Type:
Article
Language:
en
Keywords:
engineering ceramics; mechanical properties; microstructure; silica; SiO2; impurities; sintering; tetragonal zirconia polycrystal; Y-TZP; yttria stabilized zirconia; ZrO2-Y2O3
ISSN:
0924-0136
Rights:
Author can archive post-print (ie final draft post-refereeing). For full details see http://www.sherpa.ac.uk/romeo/ [Accessed 11/05/2010]
Citation Count:
2 [Scopus, 11/05/2010]

Full metadata record

DC FieldValue Language
dc.contributor.authorHodgson, S. N. B. (Simon)en
dc.contributor.authorCawley, J. D. (Jess)en
dc.contributor.authorClubley, M.en
dc.date.accessioned2010-05-11T10:06:38Z-
dc.date.available2010-05-11T10:06:38Z-
dc.date.issued1998-02-
dc.identifier.citationJournal of Materials Processing Technology; 86(1-3):139-145en
dc.identifier.issn0924-0136-
dc.identifier.doi10.1016/S0924-0136(98)00302-1-
dc.identifier.urihttp://hdl.handle.net/10149/98428-
dc.description.abstractA study has been carried out into the effects of SiO2 impurities at the 0-1 mass% level on the sintering characteristics, microstructure, phase composition, and mechanical properties of Y-TZP. The results show that SiO2 improves sintering at low temperatures, but gives rise to increasing grain boundary phase formation and reduction in sintered density for higher sintering temperatures. X-ray diffraction studies indicated that SiO2 impurities at these levels did not significantly affect the stability of the tetragonal phase responsible for the transformation-toughening phenomena, although significant effects on the mechanical properties of the material were observed. A model is proposed to account for these effects in terms of the microstructural changes associated with the presence of SiO2 and changes in sintering conditions.en
dc.language.isoenen
dc.publisherElsevieren
dc.rightsAuthor can archive post-print (ie final draft post-refereeing). For full details see http://www.sherpa.ac.uk/romeo/ [Accessed 11/05/2010]en
dc.subjectengineering ceramicsen
dc.subjectmechanical propertiesen
dc.subjectmicrostructureen
dc.subjectsilicaen
dc.subjectSiO2en
dc.subjectimpuritiesen
dc.subjectsinteringen
dc.subjecttetragonal zirconia polycrystalen
dc.subjectY-TZPen
dc.subjectyttria stabilized zirconiaen
dc.subjectZrO2-Y2O3en
dc.titleThe role of SiO2 impurities in the microstructure and properties of Y-TZPen
dc.typeArticleen
dc.contributor.departmentLoughborough University. Institute of Polymer Technology and Materials Engineering.en
dc.identifier.journalJournal of Materials Processing Technologyen
ref.citationcount2 [Scopus, 11/05/2010]en
or.citation.harvardHodgson, S. N. B., Cawley, J. and Clubley, M. (1998) 'The role of SiO2 impurities in the microstructure and properties of Y-TZP', Journal of Materials Processing Technology, 86 (1-3), pp.139-145.-
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